Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 157 (Hardcover)

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 157 By Peter W. Hawkes (Editor) Cover Image
By Peter W. Hawkes (Editor)
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Description


Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Product Details
ISBN: 9780123747686
ISBN-10: 0123747686
Publisher: Academic Press
Publication Date: August 1st, 2009
Pages: 373
Language: English
Series: Advances in Imaging and Electron Physics